Thin Film Characterization

Fraunhofer Center for Silicon Photovoltaics CSP

© Fraunhofer CSP

Thin film solar modules require high resolution and sensitive analytical tools for defect diagnostics and nanoscopic material characterization. We evaluate process- and material-induced properties of photo voltaic thin film systems (CdTe, CIGS, OPV) on the basis of advanced electrical, optical and microstructure-analytical methods. Reliability of thin film solar modules is investigated through spatially resolved yield/loss analysis and root cause diagnostics from failure in field and laboratory testing. Partners from PV industry, system managers and equipment suppliers define research and development tasks in applied defect diagnostics. Accelerated electro-optical defect localization, target preparation and material analysis help to track down defect origins in atomic dimensions within minimum of time. With a fundamental background in thin film processing the researchers supports industrial strategies in yield improvement and in line diagnostics.

On this page:

Topics

  • Defect diagnostics in thin film PV
  • Laser scribing in thin film photo voltaics

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Equipment

  • Metallography, ion and laser beam assisted sample preparation tools
  • ns laser strukturing (1064 nm, 566 nm, 355 nm)
  • inkjet printing
  • Microscopy (optical, NIR, module microscopy)
  • Electroluminescence Microscopy (EL)
  • Lock-in Thermography
  • Laser Scanning Microscopy
  • Analytical scanning electron (SEM) microscopy with EDX, EBSD, EBIC
  • Transmission electron microscopy (TEM)
  • Focused ion beam (FIB)
  • Time of flight secondary ion mass spectrometry (TofSIMS)
  • X-ray photo electron spectroscopy (XPS)
  • Scanning probe microscopy (AFM/SPM)
  • Electrical micro probe characterization
  • Scanning acoustic microscopy (SAM)

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Publications

  • Bauer, J.; Naumann, V.; Großer, S.; Hagendorf, C.; Schütze, M.; Breitenstein, O.: On the mechanism of potential-induced degradation in crystalline silicon solar cells, Physica Status Solidi - Rapid Research Letters (RRL) 6 (2012) 331-333; 278/2013

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  • Bakowskie, R.; Kesser, G.; Richter, R.; Lausch, D.; Eidner, A.; Clemens, P.; Petter, K.: Fast method to determine the structural defect density of 156 x 156 mm2 Mc-Si wafers. Energy Procedia 27 (2012) 179-184; 651/2012
  • Bauer, J.; Kwapil, W.; Lausch, D.; Schubert, M.C.; Warta, W.; Bothe, K.; Breitenstein, O.: Comments on the paper »Detection and analysis of hot-spot formation in solar cells«. Solar Energy Materials and Solar Cells 99 (2012) 362-364; 107/2012
  • Bauer, J.; Lausch, D.; Blumtritt, H.; Zakharov, N.; Breitenstein, O.: Avalanche breakdown in multicrystalline solar cells due to preferred phosphorous diffusion at extended defects. Progress in Photovoltaics Research and Applications (2012) online DOI 10.1002/pip.2220; 279/2012
  • Clement, C.; Seiffe, J.; Hofmann, M.; Rentsch, J.; Preu, R.; Naumann, V.; Werner, M.: Interface characterization of dry-etched emitters. In Proc. Of the Euorpean Photovoltaic Solar Energy Conference and Exhibition; WIP Wirtschaft und Infrastruktur GmbH & Co Planungs KG ; WIP Wirtschaft und Infrastruktur GmbH & Co Planungs KG (2011) 5 (1353-1357); 228/2012
  • Großer, S.; Lausch, D.; Werner, M.; Swatek, S.; Mergner, M.; Naumann, V.; Hagendorf, C.: Shunt analysis in solar cells - electro-optical classification and high resolution defect diagnostics. in Proc. of 2nd International Conference on Crystalline Silicon Photovoltaics SiliconPV 2012, Volume 27; Poortmans, J.; Glunz, S.; Aberle, A.; Brendel, R.; Cuevas, A.; Hahn,G.; Sinton, R.; Weeber, A. Eds.; Energy Procidia Elsevier München, Berlin (2012) 7-12; 650/2012
  • Naumann, V.; Hagendorf, C.; Großer, S.; Werner, M.; Bagdahn, J.: Micro structural root cause analysis of potential induced degradation in c-Si solar cells. In Proc. of 2nd International Conference on Crystalline Silicon Photovoltaics SiliconPV 2012, Volume 27; Poortmans, J.; Glunz, S.; Aberle, A.; Brendel, R.; Cuevas, A.; Hahn, G.; Sinton, R.; Weeber, A.; Energy Procedia Elsevier Ltd. (2012) 1-6; 624/2012
  • Naumann, V.; Hagendorf, C.; Werner, M.; Henke, B.; Schmidt, C.; Nekarda, J.-F.; Bagdahn, J.: Local electronic properties and microstructure of individual laser-fired contacts. in Proc. Of 24th European Photovoltaic Solar Energy Conference and Exhibition EU PVSEC; WIP - Renewable Energies ; WIP - Renewable Energies (2009) 2180 - 2184; 838/2012
  • Naumann, V.; Otto, M.; Wehrspohn, R. B.; Werner, M.; Hagendorf, C.: Interface and material characterization of thin ALD-Al2O3 layers on crystalline silicon. in Proc. of 2nd International Conference on Crystalline Silicon Photovoltaics SiliconPV 2012, Volume 27; Poortmans, J.; Glunz, S.; Aberle, A.; Brendel, R.; Cuevas, A.; Hahn, G.; Sinton, R.; Weeber, A.; Energy Procedia Elsevier Ltd. (2012) 312-318; 539/2012

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